The introduction of direct electron detectors significantly improved the signal-to-noise ratio of electron micrographs, resulting in a marked enhancement in the quality of cryo-electron microscope (EM) reconstructions (now referred to as the “resolution revolution”).
This approach, along with advances in image processing and data collection, has pushed the resolution of single-particle cryo-EM reconstructions into the range where the electron source could become a limiting factor. This in turn has led to the reconsideration in cryo-EM of alternatives to the standard Schottky field emission gun (FEG), such as the cold FEG, owing to their superior coherence.
Despite the known benefits of the cold FEG over thermally assisted FEG, practical limitations prevented its use in cryo-EM until JEOL’s CryoARM microscope series was developed. Cold FEG was initially used on 300 kV cryomicroscopes to push the frontier of attainable resolution, ultimately resulting in cryo-EM reconstructions at “atomic resolution” where individual atoms are visible as separated spheres of density.
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In this webinar, the speaker will present results from a cold FEG-equipped CryoARM200 microscope that demonstrates how 200 kV data can be used to produce sub-2Å structures for a range of samples. The resolution of the reconstructions is comparable to that obtained from the more expensive state-of-the-art 300 kV microscopes.
All of the results described in the webinar are from data collected in an automated manner using the open-source software SerialEM. The familiarity that many users have with SerialEM, as well as its overall openness and ease-of-use, make obtaining high-quality data on this platform possible even for users who do not have extensive experience using a CryoARM microscope.
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Register for this webinar today to gain insights into cryo-electron microscopy and how the integration of cold FEG technology in JEOL’s CryoARM200 microscope is revolutionizing cryo-EM.
Speaker
Alan Merk, Electron Microscopist, Leidos Biomedical Research
Alan spent 8 years as microscopist in the lab of Sriram Subramaniam at the Center for Cancer Research, NCI, developing methods for high-resolution data collection on a 300 kV Titan Krios. Alan then joined Jana Ognjenovic’s group at the Frederick National Laboratory, where he works on pushing resolution limits on 200 kV microscopes, including a CryoARM200.
Message PresenterWho Should Attend?
This webinar will appeal to professionals in the following fields:
- Drug discovery pharmaceutical companies
- Electron microscopy Facility Managers/Directors
- Principal Investigators with an interest in cryo-EM
- Postdocs and graduate students with an interest in cryo-EM
What You Will Learn
Attendees will learn about:
- The benefits of cold FEG technology over traditional thermally assisted FEGs
- How the integration of cold FEG into 200 kV cryomicroscopes makes atomic resolution attainable on more accessible and cost-effective instruments
- The latest advancements in cryo-EM image processing and data collection techniques
- How the open-source software SerialEM facilitates the automated collection of high-quality cryo-EM data
Xtalks Partner
JEOL
Since 1949, the JEOL legacy has been one of outstanding innovation in developing instruments used to advance scientific research and technology. JEOL has over 70 years of expertise in the field of electron microscopy, more than 60 years in mass spectrometry and NMR spectroscopy, and more than 50 years of e-beam lithography leadership.
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